TX Touch Experience Platform – The fastest, easiest way to measure thermal conductivity and effusivity
The C-Therm TCi employs the patented Modified Transient Plane Source (MTPS) technique. The one-sided, interfacial heat reflectance sensor applies a momentary constant heat source to the sample. Thermal conductivity and effusivity are measured directly, providing a detailed overview of the thermal characteristics of the sample.
1) A known current is applied to the sensor’s spiral heating element, providing a small amount of heat.
2) The sensor’s guard ring is fired simultaneously supporting a one-dimensional heat exchange between the primary sensor coil and the sample. The current applied to the coil results in a rise in temperature at the interface between the sensor and sample, which induces a change in the voltage drop of the sensor element.
3) The increase in temperature is monitored with the sensor’s voltage and is used to determine the thermo-physical properties of the sample. The thermal conductivity is inversely proportional to the rate of increase in the sensor voltage (or temperature increase). The voltage rise will be steeper for lower thermal conductivity materials (e.g. foam) and flatter for higher thermal conductivity materials (e.g.metal).